Agilent develops Voice-over-LTE Test System with Brüel & Kjaer

Agilent Technologies announced that the Agilent PXT wireless communications test set is now available for testing voice quality on Voice-over-LTE (VoLTE) 4G phones with the Brüel & Kjær PULSE Audio Analyzer and Head and Torso Simulator (HATS). Transporting voice over a packet-based LTE cellular infrastructure poses challenges that make voice-quality testing essential. The solution combines standards-based test methods with real-world base station emulation, RF test and functional test.

Testing Audio/Video Interfaces on Consumer Electronics Equipment

Today's set-top boxes, tablet PCs and smartphones are equipped with digital video interfaces such as the high-definition multimedia interface (HDMI) and the mobile high-definition link (MHL). The new R&S VTC video test center from Rohde & Schwarz can be used to test the functionality of these interfaces and their compliance with the relevant standards. The R&S VTC provides combined realtime protocol testing and audio/ video analysis including difference picture analysis, offering user equipment manufacturers the most flexible test platform on the market.

Online Seminar shows how to test High Power Devices

Keithley Instruments will webcast a free, online technical seminar titled “Fundamentals of High Power Semiconductor Device Testing” on Thursday, May 24 at 15:00 CEST. Keithley staff applications engineer Jennifer Cheney will present a broad overview of power devices and consider the key parameters of diodes, MOSFETs, and BJTs that determine end product efficiency and explain solutions for testing the key power device parameters.

High-Speed Memory Test System with 8 Gbps Test Speed

Advantest Corporation announced its next-generation high-speed DRAM test system, the T5511. The new system, which begins shipping this month, offers the industry’s fastest test speed of 8 Gbps. The T5511 has a clock training functionality built into its hardware, essential for new DDR4-SDRAM and GDDR5-SDRAM device test.

RF Analyzer to measure Time Domains and Channel Power

Agilent Technologies enhanced its FieldFox RF analyzers with options for time-domain analysis and channel-power measurements. These options give engineers the features they need to more easily and quickly test their RF communications infrastructure. With FieldFox’s time-domain analysis (Option 010) engineers can determine the individual frequency response of one of a series of reflections. Using the powerful gating function, they can remove unwanted responses such as connector mismatch or cable discontinuities.

High-Voltage Impulse Testing

The SP Technical Research Institute of Sweden offers an impulse-voltage calibration and testing service based on the international IEC60060 standard for high-voltage testing. The Yokogawa DL850 ScopeCorder is at the heart of the test set-up created by the Research Institute.

Digital RF Millivoltmeter and Frequency Counter with Rapid Response

GAO Tek Inc. is offering a digital RF millivoltmeter and frequency counter which utilizes an advanced micro-controller. It is an essential instrument for ultra-high frequency voltage measurements. This low power consuming digital RF millivoltmeter and frequency counter, model A0230003, is compact, portable and packed with outstanding features including rapid frequency response, small standing wave coefficient, high sensitivity, accuracy, reliability and high price-to-quality ratio.